Measuring materials properly involves comparing the characteristics of test structures to the real internal properties of the materials at hand. If there are plenty of differences in the materials when examined on a nano scale using atomic force microscopy, then the fundamental understanding of structure-property relationships is easily strengthened.
Scientists who are skilled in the knowledge of the general principles of nano scale measures, as well as the various approaches to nanofabrication are able to research both nanostructure materials and interpret electrical measurements as well. Atomic force microscopy makes studying probe-sample interactions a breeze, and thankfully the continued improvement of these machines keeps them relevant. Not only that, but more techniques tribotex are being developed to further its worth. One example is that it's not just used to measure characteristics, but also in detecting any material that is bothering a sample's effectiveness.
The fact that atomic force microscopy uses both contact and noncontact methods of measurement helps scientists gather evidence that they couldn't otherwise.
MEMS and NEMS
Recent studies of MEMS (microelectromechanical) and NEMS (nanoelectromechanical) systems enable those in the materials science industries to build more reliable devices. They are using ion-beam and laser machining, lithography and deep-ion etching on test specimens to name a few.